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dc.contributor.authorCHEN, HDen_US
dc.contributor.authorFENG, MSen_US
dc.contributor.authorLIN, KCen_US
dc.contributor.authorCHEN, PAen_US
dc.contributor.authorWU, CCen_US
dc.contributor.authorWU, JWen_US
dc.date.accessioned2014-12-08T15:03:58Z-
dc.date.available2014-12-08T15:03:58Z-
dc.date.issued1994-05-15en_US
dc.identifier.issn0021-8979en_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.355706en_US
dc.identifier.urihttp://hdl.handle.net/11536/2488-
dc.description.abstractAn anomalous mobility enhancement and metallic-type conductivity were observed in heavily carbon-doped GaAs grown by low-pressure metalorganic chemical vapor deposition. The 77 K mobility was slightly lower than that of 300 K for hole concentration between 1 x 10(18) and 4 x 10(18) cm-3. However, the 77 K mobility was enhanced from p > 4 X 10(18) cm-3, and the 300 K mobility slowly decreased with increasing hole concentration that ranged from 7 X 10(18) to 3 X 10(19) cm -3. As a result, the 77 K mobility was around 50%-60% greater than the 300 K mobility due to the metallic-type conductivity.en_US
dc.language.isoen_USen_US
dc.titleANOMALOUS MOBILITY ENHANCEMENT IN HEAVILY CARBON-DOPED GAASen_US
dc.typeNoteen_US
dc.identifier.doi10.1063/1.355706en_US
dc.identifier.journalJOURNAL OF APPLIED PHYSICSen_US
dc.citation.volume75en_US
dc.citation.issue10en_US
dc.citation.spage5453en_US
dc.citation.epage5455en_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.department電控工程研究所zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.contributor.departmentInstitute of Electrical and Control Engineeringen_US
dc.identifier.wosnumberWOS:A1994NN73200097-
dc.citation.woscount5-
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