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dc.contributor.authorLin, Yi-Minen_US
dc.contributor.authorHsu, Chih-Hsiangen_US
dc.contributor.authorChang, Hsie-Chiaen_US
dc.contributor.authorLee, Chen-Yien_US
dc.date.accessioned2014-12-08T15:36:34Z-
dc.date.available2014-12-08T15:36:34Z-
dc.date.issued2014-07-01en_US
dc.identifier.issn1549-8328en_US
dc.identifier.urihttp://dx.doi.org/10.1109/TCSI.2014.2298282en_US
dc.identifier.urihttp://hdl.handle.net/11536/24906-
dc.description.abstractDue to high transmission rate requirement for optical communication systems, the growing uncertainty of received signals results in the limited transmission distance. In this paper, a decision-confined soft RS decoder chip is proposed to enhance the error correcting performance with area-efficient architectures. Instead of generating numerous possible candidate codewords and determining the most likely one as output codeword, our approach produces only one codeword by confining the degree of error location polynomial. Therefore, hardware complexity is significantly reduced by eliminating decision making unit. Moreover, an iteration-reduced RiBM algorithm is provided to enlarge the coding gain by using more least reliable positions (LRPs) in the limited operation latency. According to simulation results, our proposed soft RS (255, 239; 8) decoder with 5 LRPs outperforms 0.4 dB at 10(-4) codeword error rate (CER) as compared to hard RS decoders. Implemented in standard CMOS 90 nm technology, the soft decoder chip can achieve 2.56 Gb/s throughput with similar complexity as a hard decoder. It can fit well for 10-40 Gb/s with 16 RS decoders in optical fiber systems and 2.5 Gb/s GPON applications.en_US
dc.language.isoen_USen_US
dc.subjectError correction codeen_US
dc.subjectoptical communicationen_US
dc.subjectReed-Solomon (RS) codeen_US
dc.titleA 2.56 Gb/s Soft RS (255,239) Decoder Chip for Optical Communication Systemsen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/TCSI.2014.2298282en_US
dc.identifier.journalIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERSen_US
dc.citation.volume61en_US
dc.citation.issue7en_US
dc.citation.spage2110en_US
dc.citation.epage2118en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000339045500020-
dc.citation.woscount0-
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