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dc.contributor.authorLu, Chien-Rongen_US
dc.contributor.authorLou, Shry-Fongen_US
dc.contributor.authorCheng, Hung-Hsiangen_US
dc.contributor.authorLee, Chien-Pingen_US
dc.contributor.authorTsai, Fu-Yien_US
dc.date.accessioned2014-12-08T15:36:36Z-
dc.date.available2014-12-08T15:36:36Z-
dc.date.issued2000en_US
dc.identifier.issn0021-4922en_US
dc.identifier.urihttp://hdl.handle.net/11536/24950-
dc.description.abstractThe electrooptical properties of (100) and (111)B InGaAs/GaAs strained single quantum wells have been studied by the photoreflectance spectroscopy at various temperatures and under different biases. There is a Si delta-doping sheet under the GaAs surface to screen the surface built-in electric field from the quantum well. The spectral features consist of the excitonic interband transitions in the quantum well, and the Franz-Keldysh oscillations from the band edge transitions of the GaAs barrier near the surface. The piezoelectric field tilts the (111)B single quantum well toward the Si delta-doping and causes subband filling by the electrons from the delta-doping centers. With a proper external bias to repel electrons from the tilted quantum well, the excitonic interband transition in the (111)B system is enhanced.en_US
dc.language.isoen_USen_US
dc.subjectphotoreflectanceen_US
dc.subjectstrained single quantum wellsen_US
dc.subjectpiezoelectric fielden_US
dc.subjectFranz-Keldysh oscillationsen_US
dc.titleElectrooptical Properties of InGaAs/GaAs Strained Single Quantum Wellsen_US
dc.typeArticleen_US
dc.identifier.journalJAPANESE JOURNAL OF APPLIED PHYSICSen_US
dc.citation.volume39en_US
dc.citation.issue1en_US
dc.citation.spage351en_US
dc.citation.epage352en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000209019800125-
dc.citation.woscount0-
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