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dc.contributor.authorLiu, Po-Tsunen_US
dc.contributor.authorFuh, Chur-Shyangen_US
dc.contributor.authorFan, Yang-Shunen_US
dc.contributor.authorSze, S. M.en_US
dc.date.accessioned2014-12-08T15:36:51Z-
dc.date.available2014-12-08T15:36:51Z-
dc.date.issued2014en_US
dc.identifier.issn2162-8769en_US
dc.identifier.urihttp://hdl.handle.net/11536/25253-
dc.identifier.urihttp://dx.doi.org/10.1149/2.008409jssen_US
dc.description.abstractThis work demonstrates the versatility of amorphous InZnSnO (a-IZTO) oxide semiconductor, covering from the thin film transistor (TFT) to the resistive random accessmemory (RRAM) technologies for system-on-panel applications. The high-performance a-IZTO TFTs with effective carry mobility of 39.6 cm(2)/V s, threshold voltage of -0.28 V and subthreshold swing of 0.25 decade/V are obtained in this study. Thermal post-annealing also was used to provide stable electrical characteristics with a few threshold voltage shift after positive gate bias stress. On the other hand, the RRAM device with a-IZTO film acting as active layer exhibits superior bipolar resistive switching characteristics. The wide (>10) resistance window and the stability endurance of hundreds cycle are achieved. Both of the proposed a-IZTO TFT and RRAM have promising potential to be integrated with a-IZTO-based periphery electronic circuits for flat-panel display applications. (c) 2014 The Electrochemical Society. All rights reserved.en_US
dc.language.isoen_USen_US
dc.titleInZnSnO-Based Electronic Devices for Flat Panel Display Applicationsen_US
dc.typeArticleen_US
dc.identifier.doi10.1149/2.008409jssen_US
dc.identifier.journalECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGYen_US
dc.citation.volume3en_US
dc.citation.issue9en_US
dc.citation.spageQ3054en_US
dc.citation.epageQ3057en_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.department光電工程學系zh_TW
dc.contributor.department顯示科技研究所zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.contributor.departmentDepartment of Photonicsen_US
dc.contributor.departmentInstitute of Displayen_US
dc.identifier.wosnumberWOS:000341962000012-
dc.citation.woscount0-
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