標題: An innovative model of multi-project wafer service in the foundry industry
作者: Yang, TY
Tong, LI
Yuan, BJC
工業工程與管理學系
科技管理研究所
Department of Industrial Engineering and Management
Institute of Management of Technology
關鍵字: multi-project wafer model;prototyping verification;small-volume production
公開日期: 2005
摘要: The cost of masks is rising rapidly as semiconductor manufacturing technology advances. This increase in cost is a major issue in the development of new products. This study focuses mainly on the business demands of semiconductor design companies who verify the prototypes and produce small-volume wafers, and analyses the constraints on the current Multi-Project Wafer (MPW) model. A new MPW model is proposed to reduce the mask cost and the unit die cost simultaneously. The proposed MPW model allows customers to find the optimal solution to the mask cost and unit die cost according to the chip size and the number of dice required. This study also compares the current model with the proposed MPW model using 0.13 um technology, as an example. For a purchased quantity of dice from a few thousand to less than a hundred thousand, the proposed MPW model yields the lowest sum of the mask cost and the dice cost. Since this ran-e of dice quantities covers more than half of the dice required for semiconductor products, the proposed MPW model can help the semiconductor industry to resolve the conflict between the mask cost and the unit die cost that is caused by the constraints on the current MPW model. When the technology advances to the 90 nm generation, and requested die quantities increased to more than 100,000, the small-volume MPW model proposed in this study will still yield the lowest mask cost and total dice cost.
URI: http://hdl.handle.net/11536/25523
http://dx.doi.org/10.1504/IJTM.2005.006349
ISSN: 0267-5730
DOI: 10.1504/IJTM.2005.006349
期刊: INTERNATIONAL JOURNAL OF TECHNOLOGY MANAGEMENT
Volume: 30
Issue: 1-2
起始頁: 172
結束頁: 187
Appears in Collections:Articles