標題: | Thermal gradient in solder joints under electrical-current stressing |
作者: | Shao, TL Chiu, SH Chen, C Yao, DJ Hsu, CY 材料科學與工程學系 Department of Materials Science and Engineering |
關鍵字: | SnAg3.5;solder joints;electrical current stressing;thermal gradients |
公開日期: | 1-十一月-2004 |
摘要: | The thermal gradient and temperature increase in SnAg3.5 solder joints under electrical-current stressing have been investigated by thermal infrared microscopy. Both positive and negative thermal gradients were observed under different stressing conditions. The magnitude of the thermal gradient increases with the applied current. The measured thermal gradients reached 365degreesC/cm as powered by 0.59 A, yet no obvious thermal gradient was observed when the joints were powered less than 0.25 A. The temperature increase caused by joule heating was as high as 54.5degreesC when powered by 0.59 A, yet only 3.7degreesC when stressed by 0.19 A. The location of heat generation and path of heat dissipation are believed to play crucial roles in the thermal gradient. When the major heat source is the Al trace, the thermal gradient in the solder bumps is positive; but it may become negative because the heat generated in the solder itself is more prominent. |
URI: | http://hdl.handle.net/11536/25691 |
ISSN: | 0361-5235 |
期刊: | JOURNAL OF ELECTRONIC MATERIALS |
Volume: | 33 |
Issue: | 11 |
起始頁: | 1350 |
結束頁: | 1354 |
顯示於類別: | 期刊論文 |