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dc.contributor.authorShao, TLen_US
dc.contributor.authorChiu, SHen_US
dc.contributor.authorChen, Cen_US
dc.contributor.authorYao, DJen_US
dc.contributor.authorHsu, CYen_US
dc.date.accessioned2014-12-08T15:37:21Z-
dc.date.available2014-12-08T15:37:21Z-
dc.date.issued2004-11-01en_US
dc.identifier.issn0361-5235en_US
dc.identifier.urihttp://hdl.handle.net/11536/25691-
dc.description.abstractThe thermal gradient and temperature increase in SnAg3.5 solder joints under electrical-current stressing have been investigated by thermal infrared microscopy. Both positive and negative thermal gradients were observed under different stressing conditions. The magnitude of the thermal gradient increases with the applied current. The measured thermal gradients reached 365degreesC/cm as powered by 0.59 A, yet no obvious thermal gradient was observed when the joints were powered less than 0.25 A. The temperature increase caused by joule heating was as high as 54.5degreesC when powered by 0.59 A, yet only 3.7degreesC when stressed by 0.19 A. The location of heat generation and path of heat dissipation are believed to play crucial roles in the thermal gradient. When the major heat source is the Al trace, the thermal gradient in the solder bumps is positive; but it may become negative because the heat generated in the solder itself is more prominent.en_US
dc.language.isoen_USen_US
dc.subjectSnAg3.5en_US
dc.subjectsolder jointsen_US
dc.subjectelectrical current stressingen_US
dc.subjectthermal gradientsen_US
dc.titleThermal gradient in solder joints under electrical-current stressingen_US
dc.typeArticleen_US
dc.identifier.journalJOURNAL OF ELECTRONIC MATERIALSen_US
dc.citation.volume33en_US
dc.citation.issue11en_US
dc.citation.spage1350en_US
dc.citation.epage1354en_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.identifier.wosnumberWOS:000225175100017-
dc.citation.woscount30-
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