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dc.contributor.authorCHEN, WKen_US
dc.contributor.authorOU, Jen_US
dc.contributor.authorLEE, WIen_US
dc.date.accessioned2014-12-08T15:04:05Z-
dc.date.available2014-12-08T15:04:05Z-
dc.date.issued1994-03-15en_US
dc.identifier.issn0021-4922en_US
dc.identifier.urihttp://dx.doi.org/10.1143/JJAP.33.L402en_US
dc.identifier.urihttp://hdl.handle.net/11536/2583-
dc.description.abstractThe deposition of AlAsxSb1-x films is studied systematically using an organometallic vapor phase epitaxy growth technique. It is found that the growth of AlAsSb films requires a low V/III ratio to enhance the incorporation of antimony into the solid. The composition of the alloy also depends strongly on the growth temperature. Experimental data shows that films grown at higher temperatures yield much higher AlSb contents in the AlAsxSb1-x alloys. This is contrary to the results reported for GaAsSb films. In our study, we are able to grow metastable AlAsxSb1-x epitaxial films throughout the entire range of the solid composition for temperatures above 550-degrees-C.en_US
dc.language.isoen_USen_US
dc.subjectMOVPEen_US
dc.subjectALASSBen_US
dc.subjectDISTRIBUTION COEFFICIENTen_US
dc.subjectMISCIBILITY GAPen_US
dc.titleORGANOMETALLIC VAPOR-PHASE EPITAXIAL-GROWTH OF ALASXSB1-X FILMS USING TERTIARYBUTYLARSINEen_US
dc.typeArticleen_US
dc.identifier.doi10.1143/JJAP.33.L402en_US
dc.identifier.journalJAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERSen_US
dc.citation.volume33en_US
dc.citation.issue3Ben_US
dc.citation.spageL402en_US
dc.citation.epageL404en_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:A1994NG56800002-
dc.citation.woscount11-
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