標題: | Investigation of Cu(0.5)Ni(0.5)/Nb interface transparency by using current-perpendicular-to-plane measurement |
作者: | Huang, S. Y. Liang, J. J. Hsu, S. Y. Lin, L. K. Tsai, T. C. Lee, S. F. 電子物理學系 Department of Electrophysics |
公開日期: | 1-一月-2011 |
摘要: | A direct determination of the interfacial transparency on the basis of current-perpendicular-to-plane (CPP) resistances for Cu(0.5)Ni(0.5)/Nb layered system is presented. This particular realization has substantial significance for understanding the interfacial transport in such heterostructures. The unexpected large critical thickness for this weak ferromagnetic containing system can be attributed to the strong pair-breaking effect as a result of the high interfacial transparency. Besides, the strong pair-breaking also plays a decisive role in the occurrence of the dimensionality crossover of the temperature dependent upper critical magnetic field. |
URI: | http://dx.doi.org/10.1140/epjb/e2010-10051-y http://hdl.handle.net/11536/26044 |
ISSN: | 1434-6028 |
DOI: | 10.1140/epjb/e2010-10051-y |
期刊: | EUROPEAN PHYSICAL JOURNAL B |
Volume: | 79 |
Issue: | 2 |
起始頁: | 153 |
結束頁: | 162 |
顯示於類別: | 期刊論文 |