標題: Investigation of Cu(0.5)Ni(0.5)/Nb interface transparency by using current-perpendicular-to-plane measurement
作者: Huang, S. Y.
Liang, J. J.
Hsu, S. Y.
Lin, L. K.
Tsai, T. C.
Lee, S. F.
電子物理學系
Department of Electrophysics
公開日期: 1-Jan-2011
摘要: A direct determination of the interfacial transparency on the basis of current-perpendicular-to-plane (CPP) resistances for Cu(0.5)Ni(0.5)/Nb layered system is presented. This particular realization has substantial significance for understanding the interfacial transport in such heterostructures. The unexpected large critical thickness for this weak ferromagnetic containing system can be attributed to the strong pair-breaking effect as a result of the high interfacial transparency. Besides, the strong pair-breaking also plays a decisive role in the occurrence of the dimensionality crossover of the temperature dependent upper critical magnetic field.
URI: http://dx.doi.org/10.1140/epjb/e2010-10051-y
http://hdl.handle.net/11536/26044
ISSN: 1434-6028
DOI: 10.1140/epjb/e2010-10051-y
期刊: EUROPEAN PHYSICAL JOURNAL B
Volume: 79
Issue: 2
起始頁: 153
結束頁: 162
Appears in Collections:Articles