完整後設資料紀錄
DC 欄位語言
dc.contributor.authorChang, KMen_US
dc.contributor.authorWang, HPen_US
dc.date.accessioned2014-12-08T15:38:35Z-
dc.date.available2014-12-08T15:38:35Z-
dc.date.issued2004-09-01en_US
dc.identifier.issn0026-2692en_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.mejo.2004.06.001en_US
dc.identifier.urihttp://hdl.handle.net/11536/26405-
dc.description.abstractIn this paper, an accurate and simple small signal model of RF MOSFETs accounting for the distributed gate effect, the substrate parasitics and charge conservation is proposed. Meanwhile, a direct and accurate extraction method using linear regression approach for the components of the equivalent circuit of the MOSFET with S-parameters analysis is also proposed. The proposed model and extraction method are verified with the experimental data and an excellent agreement is obtained up to 10 GHz. The extraction results from the measured data for various bias conditions are presented. Also, the extracted parameters, such as transconductance g(m), match well with those obtained from DC measurements. Besides, it is shown that a significant error in circuit performances would be found if the charge conservation is not properly considered. (C) 2004 Elsevier Ltd. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectgate resistanceen_US
dc.subjectRF MOSFET modelingen_US
dc.subjectsubstrate resistanceen_US
dc.subjectnonreciprocal capacitanceen_US
dc.titleA new small-signal MOSFET model and parameter extraction method for RF IC's applicationen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.mejo.2004.06.001en_US
dc.identifier.journalMICROELECTRONICS JOURNALen_US
dc.citation.volume35en_US
dc.citation.issue9en_US
dc.citation.spage749en_US
dc.citation.epage759en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000223676800009-
dc.citation.woscount5-
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