標題: Fully On-Chip Temperature, Process, and Voltage Sensors
作者: Chen, Shi-Wen
Chang, Ming-Hung
Hsieh, Wei-Chih
Hwang, Wei
電子與資訊研究中心
Microelectronics and Information Systems Research Center
公開日期: 2010
摘要: A process, voltage, and temperature (PVT) sensor without a voltage/current analog-to-digital converter (ADC) or bandgap reference is proposed for high accuracy, low power, and wide voltage range portable applications. Conventional temperature sensors rely on voltage/current ADC for digital output code conversion. The proposed temperature sensor generates a clock frequency proportional to the measured temperature, and converts the frequency into a corresponding digital code. The generated digital code is still under the influence of PVT variations. Two distinct sensors for voltage and process monitoring are also proposed to enhance temperature sensor environmental variation immunity. The property of zero temperature coefficient (ZTC) bias point is used to remove temperature effect. The proposed wide voltage range low power PVT sensor is designed in UMC 65nm bulk CMOS technology. It is capable of operating over a wide voltage range within 0.3V similar to V. The power consumption is no more than 3.7 mu W at 0.3V supply voltage and a high sample rate of 10k samples/sec. The temperature error is merely -0.8 similar to 0.8 degrees C.
URI: http://hdl.handle.net/11536/26609
ISBN: 978-1-4244-5309-2
ISSN: 0271-4302
期刊: 2010 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS
起始頁: 897
結束頁: 900
Appears in Collections:Conferences Paper