標題: The Impact of Uniaxial Strain on Low Frequency Noise of Nanoscale PMOSFETs with e-SiGe and i-SiGe Source/Drain
作者: Yeh, Kuo-Liang
Hong, Wei-Lun
Guo, Jyh-Chyurn
交大名義發表
National Chiao Tung University
公開日期: 2010
URI: http://hdl.handle.net/11536/26698
ISBN: 978-1-4244-6057-1
ISSN: 0149-645X
期刊: 2010 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST (MTT)
Appears in Collections:Conferences Paper