標題: Characterization of the signature of subwavelength variation from far-field irradiance
作者: Chu, SC
Chern, JL
光電工程學系
Department of Photonics
公開日期: 15-五月-2004
摘要: The dynamic signature of the subwavelength variation of a slit is shown to be determinable from far-field irradiance with a precision of better than 1 nm. One can increase the efficiency of measurement of the subwavelength's signature by adjusting the detection width over which the subwavelength variation is detected. The subwavelength variation of a rectangular aperture was also examined to show the general feasibility. (C) 2004 Optical Society of America
URI: http://dx.doi.org/10.1364/OL.29.001045
http://hdl.handle.net/11536/26771
ISSN: 0146-9592
DOI: 10.1364/OL.29.001045
期刊: OPTICS LETTERS
Volume: 29
Issue: 10
起始頁: 1045
結束頁: 1047
顯示於類別:期刊論文