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dc.contributor.authorChiu, MHen_US
dc.contributor.authorSu, DCen_US
dc.date.accessioned2014-12-08T15:01:25Z-
dc.date.available2014-12-08T15:01:25Z-
dc.date.issued1997-10-01en_US
dc.identifier.issn0003-6935en_US
dc.identifier.urihttp://hdl.handle.net/11536/270-
dc.description.abstractBased on the total-internal-reflection effect and heterodyne interferometry, an improved technique for measuring small angles is proposed. This technique not only expands the measurement range but it also improves measurement performances. Its validity is demonstrated. (C) 1997 Optical Society of America.en_US
dc.language.isoen_USen_US
dc.subjecttotal-internal-reflection effecten_US
dc.subjectheterodyne interferometryen_US
dc.titleImproved technique for measuring small anglesen_US
dc.typeArticleen_US
dc.identifier.journalAPPLIED OPTICSen_US
dc.citation.volume36en_US
dc.citation.issue28en_US
dc.citation.spage7104en_US
dc.citation.epage7106en_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.contributor.departmentDepartment of Photonicsen_US
Appears in Collections:Articles


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