標題: | Effects of oxygen on the growth of Ni induced lateral crystallization of amorphous silicon films |
作者: | Lin, YD Wu, YS Chao, CW Hu, GR 材料科學與工程學系 Department of Materials Science and Engineering |
關鍵字: | oxygen;amorphous silicon;metal induced lateral crystallization (MILC);polycrystalline silicon;nickel and nickel oxide |
公開日期: | 26-六月-2003 |
摘要: | Effects of oxygen on the growth of metal (Ni) induced lateral crystallization (MILC) of amorphous silicon have been investigated. It is found that the oxygen in the annealing ambient did not degrade the MILC length or growth rate. The oxygen existence in Ni film does not degrade the MILC growth rate either. However, it retards the nucleation of poly-Si for about 4 h. This is because that NiO needed an incubation period to be reduced to nickel metal for the subsequent mediated crystallization of a-Si process. (C) 2003 Elsevier Science B.V. All rights reserved. |
URI: | http://dx.doi.org/10.1016/S0254-0584(03)00108-1 http://hdl.handle.net/11536/27782 |
ISSN: | 0254-0584 |
DOI: | 10.1016/S0254-0584(03)00108-1 |
期刊: | MATERIALS CHEMISTRY AND PHYSICS |
Volume: | 80 |
Issue: | 3 |
起始頁: | 577 |
結束頁: | 580 |
顯示於類別: | 期刊論文 |