| 標題: | Analysis of the proximity effect and the interface transparency with perpendicular current in Ni/Nb system |
| 作者: | Huang, S. Y. Chiu, Y. C. Liang, J. J. Lin, L. K. Tsai, T. C. Hsu, S. Y. Lee, S. F. 電子物理學系 Department of Electrophysics |
| 公開日期: | 1-四月-2009 |
| 摘要: | We quantitatively study the interface resistance in Ni/Nb multilayers fabricated by sputtering system. For a fixed Ni layer thickness in Ni/Nb/Ni trilayers, the superconducting temperature T(c) decreases with decreasing Nb thickness. By analyzing the data with the proximity effect, the critical thickness below which superconductivity vanished was deduced. From current perpendicular to plane (CPP) measurement interpreted with a one-band series-resistor model, we obtained the CPP resistivities of Nb and Ni and the unit area resistances of 4.2 +/- 0.2 and 1.5 +/- 0.4 f Omega m(2) for superconducting and normal Ni/ Nb interfaces. The transparency parameter is directly calculated in terms of interface resistance. (C) 2009 American Institute of Physics. [DOI: 10.1063/1.3073657] |
| URI: | http://dx.doi.org/10.1063/1.3073657 http://hdl.handle.net/11536/27831 |
| ISSN: | 0021-8979 |
| DOI: | 10.1063/1.3073657 |
| 期刊: | JOURNAL OF APPLIED PHYSICS |
| Volume: | 105 |
| Issue: | 7 |
| 結束頁: | |
| 顯示於類別： | 會議論文 |
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- Investigation of Cu(0.5)Ni(0.5)/Nb interface transparency by using current-perpendicular-to-plane measurement / Huang, S. Y.;Liang, J. J.;Hsu, S. Y.;Lin, L. K.;Tsai, T. C.
- Investigation of Cu0.5Ni0.5/Nb interface transparency by using current-perpendicular-to-plane measurement / Huang, S. Y.;Liang, J. J.;Hsu, S. Y.;Lin, L. K.;Tsai, T. C.
- Dimensional crossover and flux pinning of decoupled Cu(50)Ni(50)/Nb multilayers / Huang, S. Y.;Liang, J. -J.;Tsai, T. C.;Lin, L. K.;Lin, M. S.
- Analysis of diffusive interface resistance for measurements with perpendicular current in Fe/Nb multilayers / Huang, S. Y.;Lee, S. F.;Yu, C. Y.;Hsu, S. Y.;Yao, Y. D.
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