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dc.contributor.authorPearn, WLen_US
dc.contributor.authorLin, GHen_US
dc.date.accessioned2014-12-08T15:41:08Z-
dc.date.available2014-12-08T15:41:08Z-
dc.date.issued2003-04-01en_US
dc.identifier.issn0026-2714en_US
dc.identifier.urihttp://dx.doi.org/10.1016/S0026-2714(02)00323-2en_US
dc.identifier.urihttp://hdl.handle.net/11536/27990-
dc.description.abstractProcess capability indices C-PU and C-PL are developed in the manufacturing industry to provide quantitative measures on process potential and performance. for processes with one-sided specification limits. Statistical properties of the estimators of C-PU and C-PL have been investigated extensively, but only restricted to cases with single samples. In this paper, we consider the estimation and capability testing of C-PU and C-PL based on multiple samples. We show that the proposed estimator of C-PU and C-PL are indeed the uniformly minimum variance unbiased estimators (UMVUEs). A simple procedure based on a hypothesis testing using the UMVUE is developed for the practitioners to use for judging whether a stable process meets the preset capability requirement. (C) 2002 Elsevier Science Ltd. All rights reserved.en_US
dc.language.isoen_USen_US
dc.titleA reliable procedure for testing linear regulators with one-sided specification limits based on multiple samplesen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/S0026-2714(02)00323-2en_US
dc.identifier.journalMICROELECTRONICS RELIABILITYen_US
dc.citation.volume43en_US
dc.citation.issue4en_US
dc.citation.spage651en_US
dc.citation.epage664en_US
dc.contributor.department工業工程與管理學系zh_TW
dc.contributor.departmentDepartment of Industrial Engineering and Managementen_US
dc.identifier.wosnumberWOS:000182363300018-
dc.citation.woscount4-
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