完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Hu, SF | en_US |
dc.contributor.author | Wong, WZ | en_US |
dc.contributor.author | Liu, SS | en_US |
dc.contributor.author | Wu, YC | en_US |
dc.contributor.author | Sung, CL | en_US |
dc.contributor.author | Huang, TY | en_US |
dc.date.accessioned | 2014-12-08T15:41:22Z | - |
dc.date.available | 2014-12-08T15:41:22Z | - |
dc.date.issued | 2003-02-01 | en_US |
dc.identifier.issn | 0038-1098 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1016/S0038-1098(02)00807-4 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/28136 | - |
dc.description.abstract | Quantum effects in silicon nanowires due to one-dimensional carrier confinement were observed at room temperature. Electrical transport properties were measured, on narrow thin-silicon-on-insulator wires that were defined by e-beam lithography and further narrowed and thinned down by oxidation to a final thickness of around 3 nm, and a width of 29 nm. The room temperature current-voltage characteristics of the resulting silicon nanowires are shown to exhibit a zero current state may be due to the occurrence of Coulomb blockade. (C) 2003 Elsevier Science Ltd. All rights reserved | en_US |
dc.language.iso | en_US | en_US |
dc.subject | nanostructures | en_US |
dc.subject | nanofabrications | en_US |
dc.subject | tunnelling | en_US |
dc.title | Room temperature two-terminal characteristics in silicon nanowires | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1016/S0038-1098(02)00807-4 | en_US |
dc.identifier.journal | SOLID STATE COMMUNICATIONS | en_US |
dc.citation.volume | 125 | en_US |
dc.citation.issue | 6 | en_US |
dc.citation.spage | 351 | en_US |
dc.citation.epage | 354 | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000180722900012 | - |
dc.citation.woscount | 11 | - |
顯示於類別: | 期刊論文 |