標題: | CURRENT GAINS OF ALAS/GAAS TUNNELING EMITTER BIPOLAR-TRANSISTORS WITH 25-500-ANGSTROM BARRIER THICKNESS |
作者: | CHEN, HR LEE, CP CHANG, CY TSAI, KL TSANG, JS 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
關鍵字: | SEMICONDUCTOR DEVICES;HETEROJUNCTION BIPOLAR TRANSISTORS;TUNNELING STRUCTURES |
公開日期: | 14-Oct-1993 |
摘要: | The current gain of an AlAs/GaS tunnelling emitter bipolar transistor (TEBT) is found to increase monotonically with barrier thickness in the range 25-200 angstrom and fall off for barrier thickness increasing from 200 to 500 angstrom. It is found that a thicker barrier can suppress the base-to-emitter hole injection better and increase the current gain, but a barrier which is too thick decreases the current gain due to the suppression of the electron current. |
URI: | http://hdl.handle.net/11536/2820 |
ISSN: | 0013-5194 |
期刊: | ELECTRONICS LETTERS |
Volume: | 29 |
Issue: | 21 |
起始頁: | 1883 |
結束頁: | 1884 |
Appears in Collections: | Articles |
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