标题: Effect of annealing on the structural and optical properties of AgGaS2 thin films prepared by pulsed laser deposition
作者: Hsu, HC
Chen, HH
Kuo, SY
Chang, CS
Hsieh, WF
光电工程学系
Department of Photonics
关键字: X-ray diffraction;photoluminescence;optical properties
公开日期: 1-十一月-2002
摘要: The influence of annealing on the AgGaS2 films groom by pulsed laser deposition has been investigated. The X-ray diffraction results show the AgGaS2 films were found with preferential orientation (1 1 2) normal to the surface and silver droplets,were diminished after the post-annealing. Photoluminescence (PL) measurements reveled the exciton energy is slightly red shifted that is possibly due to the thermal strain effect. The binding energy of the shallow, donors is similar to28 meV determined from temperature dependent PL spectra, In addition, the A-exciton and the B/C-exciton could be observed in the transmittance spectra at room temperature. (C) 2002 Elsevier Science B.V. All rights reserved.
URI: http://dx.doi.org/10.1016/S0040-6090(02)00743-5
http://hdl.handle.net/11536/28407
ISSN: 0040-6090
DOI: 10.1016/S0040-6090(02)00743-5
期刊: THIN SOLID FILMS
Volume: 419
Issue: 1-2
起始页: 237
结束页: 241
显示于类别:Articles


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