完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Ker, MD | en_US |
dc.contributor.author | Chen, TY | en_US |
dc.contributor.author | Wu, CY | en_US |
dc.date.accessioned | 2014-12-08T15:41:59Z | - |
dc.date.available | 2014-12-08T15:41:59Z | - |
dc.date.issued | 2002-09-01 | en_US |
dc.identifier.issn | 0925-1030 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1023/A:1020351709833 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/28544 | - |
dc.description.abstract | An ESD protection design is proposed to solve the ESD protection challenge to the analog pins for high-frequency or current-mode applications. By including an efficient power-rails clamp circuit into the analog I/O pin, the device dimension (W/L) of ESD clamp device connected to the I/O pad in the analog ESD protection circuit can be reduced to only 50/0.5 (mum/mum) in a 0.35-mum silicided CMOS process, but it can sustain the human-body-model (machine-model) ESD level of up to 6 kV (400 V). With such a smaller device dimension, the input capacitance of this analog ESD protection circuit can be significantly reduced to only similar to1.0 pF (including the bond pad capacitance) for high-frequency applications. A design model to find the optimized layout dimensions and spacings on the input ESD clamp devices has been also developed to keep the total input capacitance almost constant (within 1% variation), even if the analog input signal has a dynamic range of 1 V. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | electrostatic discharge (ESD) | en_US |
dc.subject | ESD protection circuit | en_US |
dc.subject | input capacitance | en_US |
dc.subject | analog pin | en_US |
dc.title | Design and analysis of on-chip ESD protection circuit with very low input capacitance for high-precision analog applications | en_US |
dc.type | Article; Proceedings Paper | en_US |
dc.identifier.doi | 10.1023/A:1020351709833 | en_US |
dc.identifier.journal | ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING | en_US |
dc.citation.volume | 32 | en_US |
dc.citation.issue | 3 | en_US |
dc.citation.spage | 257 | en_US |
dc.citation.epage | 278 | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000178096200007 | - |
顯示於類別: | 會議論文 |