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dc.contributor.authorLin, TCen_US
dc.contributor.authorWu, JCen_US
dc.date.accessioned2014-12-08T15:42:05Z-
dc.date.available2014-12-08T15:42:05Z-
dc.date.issued2002-08-01en_US
dc.identifier.issn0916-8524en_US
dc.identifier.urihttp://hdl.handle.net/11536/28590-
dc.description.abstractMOSFETs can be used as capacitors, but its capacitance can vary by 5 to 7 times as its terminal voltage varies. To reduce the voltage dependence of the capacitance, this paper proposed two types of devices: one is called accumulation MOSFET (AMOS) and the other is formed by two conventional PMOS connected in anti-parallel. These two devices are readily available in the standard digital CMOS processes. The proposed capacitors were implemented in three different CMOS processes. The measured results show that the capacitances of both devices have less voltage dependence than a single PMOS. The voltage dependence of the AMOS capacitance can be as small as 17%. The minimum capacitance per unit area of the AMOS is 1.8 times that of the double-poly capacitor in an analog/mixed-mode CMOS process. To verify the usefulness of these two types of capacitors, they are used as compensation capacitors in a conventional two-stage amplifier. The measured results show that the amplifier compensated by the AMOS capacitor has little variation (6%) of the unity-gain frequency over the input common-mode range. Due to its smaller die area and cheaper digital process, AMOS can be used as compensation capacitor without resorting to more expensive analog process.en_US
dc.language.isoen_USen_US
dc.subjectanti-parallel connected PMOS capacitorsen_US
dc.subjectaccumulation MOSFET (AMOS)en_US
dc.subjectMiller compensationen_US
dc.subjecttwo-stage amplifieren_US
dc.titleImplementing compensation capacitor in logic CMOS processesen_US
dc.typeArticleen_US
dc.identifier.journalIEICE TRANSACTIONS ON ELECTRONICSen_US
dc.citation.volumeE85Cen_US
dc.citation.issue8en_US
dc.citation.spage1642en_US
dc.citation.epage1650en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000177439200017-
dc.citation.woscount0-
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