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dc.contributor.authorChen, KHen_US
dc.contributor.authorHsu, CCen_US
dc.contributor.authorSu, DCen_US
dc.date.accessioned2014-12-08T15:42:08Z-
dc.date.available2014-12-08T15:42:08Z-
dc.date.issued2002-08-01en_US
dc.identifier.issn0030-4018en_US
dc.identifier.urihttp://dx.doi.org/10.1016/S0030-4018(02)01641-3en_US
dc.identifier.urihttp://hdl.handle.net/11536/28618-
dc.description.abstractA linearly polarized light is incident on a surface plasmon resonance (SPR) apparatus at the resonant angle. the surface plasmons are excited, Small wavelength shifts will introduce phase difference variations between s- and p-polarizations of the reflected light. These phase difference variations can be measured accurately by using heterodyne interferometry. Based on these facts, a novel method for measuring small wavelength shifts is proposed. It has the advantages of both common-path interferometry and heterodyne interferometry. (C) 2002 Elsevier Science B.V. All rights reserved.en_US
dc.language.isoen_USen_US
dc.titleMeasurement of wavelength shift by using surface plasmon resonance heterodyne interferometryen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/S0030-4018(02)01641-3en_US
dc.identifier.journalOPTICS COMMUNICATIONSen_US
dc.citation.volume209en_US
dc.citation.issue1-3en_US
dc.citation.spage167en_US
dc.citation.epage172en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000177194400018-
dc.citation.woscount23-
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