Measurement of wavelength shift by using surface plasmon resonance heterodyne interferometry

doi:10.1016/S0030-4018(02)01641-3

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DC 欄位	值	語言
dc.contributor.author	Chen, KH	en_US
dc.contributor.author	Hsu, CC	en_US
dc.contributor.author	Su, DC	en_US
dc.date.accessioned	2014-12-08T15:42:08Z	-
dc.date.available	2014-12-08T15:42:08Z	-
dc.date.issued	2002-08-01	en_US
dc.identifier.issn	0030-4018	en_US
dc.identifier.uri	http://dx.doi.org/10.1016/S0030-4018(02)01641-3	en_US
dc.identifier.uri	http://hdl.handle.net/11536/28618	-
dc.description.abstract	A linearly polarized light is incident on a surface plasmon resonance (SPR) apparatus at the resonant angle. the surface plasmons are excited, Small wavelength shifts will introduce phase difference variations between s- and p-polarizations of the reflected light. These phase difference variations can be measured accurately by using heterodyne interferometry. Based on these facts, a novel method for measuring small wavelength shifts is proposed. It has the advantages of both common-path interferometry and heterodyne interferometry. (C) 2002 Elsevier Science B.V. All rights reserved.	en_US
dc.language.iso	en_US	en_US
dc.title	Measurement of wavelength shift by using surface plasmon resonance heterodyne interferometry	en_US
dc.type	Article	en_US
dc.identifier.doi	10.1016/S0030-4018(02)01641-3	en_US
dc.identifier.journal	OPTICS COMMUNICATIONS	en_US
dc.citation.volume	209	en_US
dc.citation.issue	1-3	en_US
dc.citation.spage	167	en_US
dc.citation.epage	172	en_US
dc.contributor.department	光電工程學系	zh_TW
dc.contributor.department	Department of Photonics	en_US
dc.identifier.wosnumber	WOS:000177194400018	-
dc.citation.woscount	23	-
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