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dc.contributor.authorSHIN, NFen_US
dc.contributor.authorCHEN, JYen_US
dc.contributor.authorJEN, TSen_US
dc.contributor.authorHONG, JWen_US
dc.contributor.authorCHANG, CYen_US
dc.date.accessioned2014-12-08T15:04:22Z-
dc.date.available2014-12-08T15:04:22Z-
dc.date.issued1993-09-01en_US
dc.identifier.issn0741-3106en_US
dc.identifier.urihttp://dx.doi.org/10.1109/55.244709en_US
dc.identifier.urihttp://hdl.handle.net/11536/2877-
dc.description.abstractHydrogenated amorphous silicon carbide (a-SiC:H) p-i-n thin-film light-emitting diodes (TFLED's) with graded p+-i and i-n+ junctions have been proposed and fabricated successfully on an indium-tin-oxide (ITO)-coated glass. An obtained orange TFLED reveals a brightness of 207 cd/m2 at an injection current density of 600 mA/cm2, which is the brightest one ever reported for a-SiC:H TFLED's at the same injection current density. This significant increase of brightness could be ascribed to the combined effect of reduced interface states by using the graded-gap junctions, lower contact resistance due to post-metallization annealing, and higher optical gaps of the doped layers.en_US
dc.language.isoen_USen_US
dc.titleHYDROGENATED AMORPHOUS-SILICON CARBIDE DOUBLE GRADED-GAP P-I-N THIN-FILM LIGHT-EMITTING-DIODESen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/55.244709en_US
dc.identifier.journalIEEE ELECTRON DEVICE LETTERSen_US
dc.citation.volume14en_US
dc.citation.issue9en_US
dc.citation.spage453en_US
dc.citation.epage455en_US
dc.contributor.department電控工程研究所zh_TW
dc.contributor.departmentInstitute of Electrical and Control Engineeringen_US
dc.identifier.wosnumberWOS:A1993LU16600010-
dc.citation.woscount9-
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