標題: Nanostructure patterns written in polycarbonate by a bent optical fiber probe
作者: Chen, SH
Chen, YF
電子物理學系
Department of Electrophysics
公開日期: 1-十一月-2001
摘要: An atomic force, microscope operated in tapping mode using a homemade bent optical fiber probe was used to pattern nanometer-scale features. Trenches of different dimensions were written on polycarbonate that was pre-exposed to an excimer laser. Lines with widths varying from 260 to 600 nm and depths ranging from 30 to 120 nm have been made. The present technique as a complementary tool to other lithographic processes has been demonstrated to be potentially suitable for low-cost and high-precision applications. (C) 2001 American Vacuum Society.
URI: http://dx.doi.org/10.1116/1.1421555
http://hdl.handle.net/11536/29302
ISSN: 1071-1023
DOI: 10.1116/1.1421555
期刊: JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
Volume: 19
Issue: 6
起始頁: 2299
結束頁: 2300
顯示於類別:期刊論文


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