標題: | Nanostructure patterns written in polycarbonate by a bent optical fiber probe |
作者: | Chen, SH Chen, YF 電子物理學系 Department of Electrophysics |
公開日期: | 1-十一月-2001 |
摘要: | An atomic force, microscope operated in tapping mode using a homemade bent optical fiber probe was used to pattern nanometer-scale features. Trenches of different dimensions were written on polycarbonate that was pre-exposed to an excimer laser. Lines with widths varying from 260 to 600 nm and depths ranging from 30 to 120 nm have been made. The present technique as a complementary tool to other lithographic processes has been demonstrated to be potentially suitable for low-cost and high-precision applications. (C) 2001 American Vacuum Society. |
URI: | http://dx.doi.org/10.1116/1.1421555 http://hdl.handle.net/11536/29302 |
ISSN: | 1071-1023 |
DOI: | 10.1116/1.1421555 |
期刊: | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B |
Volume: | 19 |
Issue: | 6 |
起始頁: | 2299 |
結束頁: | 2300 |
顯示於類別: | 期刊論文 |