DESIGN OF PSEUDOEXHAUSTIVE TESTABLE PLA WITH LOW OVERHEAD

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DC Field	Value	Language
dc.contributor.author	SHEN, WZ	en_US
dc.contributor.author	HWANG, GH	en_US
dc.contributor.author	HSU, WJ	en_US
dc.contributor.author	JAN, YJ	en_US
dc.date.accessioned	2014-12-08T15:04:26Z	-
dc.date.available	2014-12-08T15:04:26Z	-
dc.date.issued	1993-07-01	en_US
dc.identifier.issn	0018-9340	en_US
dc.identifier.uri	http://dx.doi.org/10.1109/12.237730	en_US
dc.identifier.uri	http://hdl.handle.net/11536/2948	-
dc.description.abstract	The pseudoexhaustive testing (PET) scheme is a economic approach to test a large embedded programmable logic array (PIA). In this paper, we propose an efficient algorithm named low overhead PET (LOPET) to partition the product lines. By applying our algorithm, both the area overhead and test length are reduced significantly.	en_US
dc.language.iso	en_US	en_US
dc.subject	BUILT-IN SELF-TEST	en_US
dc.subject	DESIGN FOR TESTABILITY	en_US
dc.subject	PROGRAMMABLE LOGIC ARRAY	en_US
dc.subject	PSEUDOEXHAUSTIVE TESTING	en_US
dc.title	DESIGN OF PSEUDOEXHAUSTIVE TESTABLE PLA WITH LOW OVERHEAD	en_US
dc.type	Letter	en_US
dc.identifier.doi	10.1109/12.237730	en_US
dc.identifier.journal	IEEE TRANSACTIONS ON COMPUTERS	en_US
dc.citation.volume	42	en_US
dc.citation.issue	7	en_US
dc.citation.spage	887	en_US
dc.citation.epage	891	en_US
dc.contributor.department	電控工程研究所	zh_TW
dc.contributor.department	Institute of Electrical and Control Engineering	en_US
dc.identifier.wosnumber	WOS:A1993MB58300012	-
dc.citation.woscount	1	-
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