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dc.contributor.authorHo, Yen-Tengen_US
dc.contributor.authorLiang, Mei-Huien_US
dc.contributor.authorHsiao, Feng-Keen_US
dc.contributor.authorWang, Wei-Linen_US
dc.contributor.authorPeng, Chun-Yenen_US
dc.contributor.authorChen, Wei-Daen_US
dc.contributor.authorLee, Wei-Ien_US
dc.contributor.authorChang, Lien_US
dc.date.accessioned2014-12-08T15:43:56Z-
dc.date.available2014-12-08T15:43:56Z-
dc.date.issued2008-04-01en_US
dc.identifier.issn0022-0248en_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.jcrysgro.2007.11.047en_US
dc.identifier.urihttp://hdl.handle.net/11536/29709-
dc.description.abstractNon-polar (1 1 (2) over bar 0) GaN has been successfully grown on (0 0 1) LaAlO3 (LAO) substrate by pulsed laser deposition method. The nitrogen plasma is essential to grow pure a-plane GaN films. The insertion of a ZnO buffer layer improves the quality of GaN thin film as shown by X-ray diffraction. Reflection high energy electron diffraction and cross-sectional transmission electron microscopy with selected area diffraction reveal two types of a-plane GaN domains perpendicular to each other in orientation relationships of [0 0 0 1](GaN)parallel to[1 (1) over bar 0](LAO) and [1 (1) over bar 0 0](GaN)parallel to[1 (1) over bar 0](LAO). (C) 2007 Elsevier B.V. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectX-ray diffractionen_US
dc.subjectlaser epitaxyen_US
dc.subjectnitrideen_US
dc.titleNon-polar a-plane GaN grown on LaAlO3 (001) substrate by pulsed laser depositionen_US
dc.typeArticle; Proceedings Paperen_US
dc.identifier.doi10.1016/j.jcrysgro.2007.11.047en_US
dc.identifier.journalJOURNAL OF CRYSTAL GROWTHen_US
dc.citation.volume310en_US
dc.citation.issue7-9en_US
dc.citation.spage1614en_US
dc.citation.epage1618en_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000255843200056-
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