THE REFRACTIVE-INDEX OF INP AND ITS OXIDE MEASURED BY MULTIPLE-ANGLE INCIDENT ELLIPSOMETRY

标题:	THE REFRACTIVE-INDEX OF INP AND ITS OXIDE MEASURED BY MULTIPLE-ANGLE INCIDENT ELLIPSOMETRY
作者:	CHAO, TS LEE, CL LEI, TF 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics
公开日期:	15-五月-1993
URI:	http://dx.doi.org/10.1007/BF00626698 http://hdl.handle.net/11536/3015
ISSN:	0261-8028
DOI:	10.1007/BF00626698
期刊:	JOURNAL OF MATERIALS SCIENCE LETTERS
Volume:	12
Issue:	10
起始页:	721
结束页:	723
显示于类别：	Articles

APA	CHAO, T., LEE, C., & LEI, T. (1993). THE REFRACTIVE-INDEX OF INP AND ITS OXIDE MEASURED BY MULTIPLE-ANGLE INCIDENT ELLIPSOMETRY. WOS:A1993LE39800011.
Bibtex	@article{CHAO1993THE, title={THE REFRACTIVE-INDEX OF INP AND ITS OXIDE MEASURED BY MULTIPLE-ANGLE INCIDENT ELLIPSOMETRY}, author={CHAO, TS and LEE, CL and LEI, TF}, journal={WOS:A1993LE39800011}, year={1993}, url={https://ir.lib.nycu.edu.tw/handle/11536/3015?locale=zh_CN}, }