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dc.contributor.authorChang, EYen_US
dc.contributor.authorLee, DHen_US
dc.contributor.authorChen, SHen_US
dc.date.accessioned2014-12-08T15:44:44Z-
dc.date.available2014-12-08T15:44:44Z-
dc.date.issued2000-10-15en_US
dc.identifier.issn0021-4922en_US
dc.identifier.urihttp://dx.doi.org/10.1143/JJAP.39.L1019en_US
dc.identifier.urihttp://hdl.handle.net/11536/30201-
dc.description.abstractA 1.2 V GaAs power pseudomorphic high electron mobility transistors (PHEMT's) for personal handy phone system (PHS) handset application was developed. The power PHEMT has a dual delta doped AlGaAs/InGaAs/GaAs based structure with compact device layout. The 6.72 mm device exhibits maximum power added efficiency (PAE) of 43.62% at 1.2V drain bias with an output power of 22.18 dBm. Under 1.9 GHz pi /4-shifted quadrature phase shift keying (QPSK) modulated PHS signal, the device shows an adjacent channel leakage power (P-adj) Of -56.86 dBc at 600 kHz apart from the center frequency and a linear efficiency of 41.31%. This is the first report on the 1.2-V operation power PHEMT for PHS handset application so far.en_US
dc.language.isoen_USen_US
dc.subjectPHSen_US
dc.subjectlow voltage handset applicationen_US
dc.subjectGaAsen_US
dc.subjectpower PHEMTen_US
dc.titleA 1.2-V operation power pseudomorphic high electron mobility transistor for personal handy phone handset applicationen_US
dc.typeArticleen_US
dc.identifier.doi10.1143/JJAP.39.L1019en_US
dc.identifier.journalJAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERSen_US
dc.citation.volume39en_US
dc.citation.issue10Ben_US
dc.citation.spageL1019en_US
dc.citation.epageL1022en_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.identifier.wosnumberWOS:000090138800003-
dc.citation.woscount1-
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