完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Wang, DP | en_US |
dc.contributor.author | Huang, KM | en_US |
dc.contributor.author | Shen, TL | en_US |
dc.contributor.author | Huang, KF | en_US |
dc.contributor.author | Huang, TC | en_US |
dc.date.accessioned | 2014-12-08T15:01:27Z | - |
dc.date.available | 2014-12-08T15:01:27Z | - |
dc.date.issued | 1997-09-15 | en_US |
dc.identifier.issn | 0021-8979 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/304 | - |
dc.description.abstract | The electroreflectance spectra of surface-intrinsic-n(+)-type-doped GaAs were measured at various bias voltages (V-bias). Results revealed many Franz-Keldysh oscillations (FKOs) above the band-gap energy, which have been attributed to a uniform electric field (F) in the undoped layer below the surface. However, there has been no other evidence for the uniformity of F in the undoped layer. Since it is known that F can be deduced from the periods of the FKOs, the relations between F and V-bias can, thereby, be obtained. The nearly linear relation, thus found, confirms the existence of a nearly uniform field in the undoped layer. From the plot of F against V-bias,the Values of the thickness of the undoped layer and the barrier height can also be evaluated. (C) 1997 American Institute of Physics. | en_US |
dc.language.iso | en_US | en_US |
dc.title | Electroreflectance of surface-intrinsic- n(+)-type doped GaAs | en_US |
dc.type | Article | en_US |
dc.identifier.journal | JOURNAL OF APPLIED PHYSICS | en_US |
dc.citation.volume | 82 | en_US |
dc.citation.issue | 6 | en_US |
dc.citation.spage | 3089 | en_US |
dc.citation.epage | 3091 | en_US |
dc.contributor.department | 電子物理學系 | zh_TW |
dc.contributor.department | Department of Electrophysics | en_US |
顯示於類別: | 期刊論文 |