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dc.contributor.authorChen, HMen_US
dc.contributor.authorChen, YFen_US
dc.contributor.authorLee, MCen_US
dc.contributor.authorFeng, MSen_US
dc.date.accessioned2019-04-03T06:38:43Z-
dc.date.available2019-04-03T06:38:43Z-
dc.date.issued1997-09-15en_US
dc.identifier.issn0163-1829en_US
dc.identifier.urihttp://dx.doi.org/10.1103/PhysRevB.56.6942en_US
dc.identifier.urihttp://hdl.handle.net/11536/305-
dc.description.abstractPhotoluminescence, resonant Raman scattering, and photoconductivity measurements have been employed to study the yellow; emission in undoped n-type and a set of Se-doped GaN epitaxial films. It is best described by a transition from the conduction-band edge to a deep acceptor. Unlike the donors and accepters used in most previous studies that substitute Ga sires, Se atoms can replace N sites. With this unique fact, we identify that the origin of the yellow emission involves the nitrogen antisite. In addition, it is found that persistent photoconductivity can be observed after the yellow; band excitation, We further suggest that the nitrogen antisite exhibits a metastable behavior similar to the arsenic antisite in GaAs.en_US
dc.language.isoen_USen_US
dc.titleYellow luminescence in n-type GaN epitaxial filmsen_US
dc.typeArticleen_US
dc.identifier.doi10.1103/PhysRevB.56.6942en_US
dc.identifier.journalPHYSICAL REVIEW Ben_US
dc.citation.volume56en_US
dc.citation.issue11en_US
dc.citation.spage6942en_US
dc.citation.epage6946en_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:A1997XY80600083en_US
dc.citation.woscount109en_US
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