完整後設資料紀錄
DC 欄位語言
dc.contributor.authorYANG, Cen_US
dc.date.accessioned2014-12-08T15:04:35Z-
dc.date.available2014-12-08T15:04:35Z-
dc.date.issued1993-04-01en_US
dc.identifier.issn0026-2714en_US
dc.identifier.urihttp://hdl.handle.net/11536/3079-
dc.description.abstractGiven a characteristic polynomial p(x) and a sampling polynomial with respect to p(x), a designer likes to know whether the sampling polynomial is a dependency polynomial. A dependency polynomial gives low fault coverage in the built-in self test. The tool LDC computes the residue combinations of the factors in the set polynomial and advises designers if the sampling polynomial covers all the testing space. When the sampling polynomial is a dependency polynomial, LDC will try to find one, if any, independent polynomial at a minimum cost. In cases of short test vectors LDC can exhaustively enumerate all independent polynomials for the designers to choose from. This paper reviews the basics of the linear dependency computation, explains the LDC capabilities and its usefulness, and discusses the computational issues of the problem.en_US
dc.language.isoen_USen_US
dc.titleLINEAR DEPENDENCY CHECK IN BUILT-IN TESTen_US
dc.typeArticleen_US
dc.identifier.journalMICROELECTRONICS AND RELIABILITYen_US
dc.citation.volume33en_US
dc.citation.issue5en_US
dc.citation.spage633en_US
dc.citation.epage636en_US
dc.contributor.department資訊管理與財務金融系 註:原資管所+財金所zh_TW
dc.contributor.departmentDepartment of Information Management and Financeen_US
dc.identifier.wosnumberWOS:A1993KW04900002-
dc.citation.woscount0-
顯示於類別:期刊論文