Fuzzy-based CMOS circuit partitioning in built-in current testing

Abstract

We propose a fuzzy-based approach which pro,ides a soft threshold to determine the module size for CMOS circuit partitioning in built-in current testing (BICT). Experimental results show that our design approach indeed provides a feasible way to exploit the design space of BICT partitioning in comparison with other approaches with a fixed threshold, and a better module size can thus he determined to reflect a change of circuit properties.