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dc.contributor.authorShiau, JJHen_US
dc.contributor.authorLin, HHen_US
dc.date.accessioned2014-12-08T15:46:30Z-
dc.date.available2014-12-08T15:46:30Z-
dc.date.issued1999-06-01en_US
dc.identifier.issn0018-9529en_US
dc.identifier.urihttp://dx.doi.org/10.1109/24.784273en_US
dc.identifier.urihttp://hdl.handle.net/11536/31291-
dc.description.abstractThis paper presents a nonparametric regression accelerated life-stress (NPRALS) model for accelerated degradation data wherein the data consist of groups of degrading curve data. In contrast to the usual parametric modeling, a nonparametric regression model relaxes assumptions on the form of the regression functions and lets data speak for themselves in searching for a suitable model for data. NPRALS assumes that various stress levels affect only the degradation rate, but not the shape of the degradation curve. An algorithm is presented for estimating the components of NPRALS. By investigating the relationship between the acceleration factors and the stress levels, the mean time to failure estimate of the product under the usual use condition is obtained. The procedure is applied to a set of data obtained from an accelerated degradation test for a light emitting diode product. The results look very promising. The performance of NPRALS is further checked by a simulated example and found satisfactory. We anticipate that NPRALS can be applied to other applications as well.en_US
dc.language.isoen_USen_US
dc.subjectaccelerated degradation testen_US
dc.subjectacceleration factoren_US
dc.subjectaccelerated life-stress degradation modelen_US
dc.subjectlocal linear regression smootheren_US
dc.subjectnonparametric regressionen_US
dc.subjectstochastic processen_US
dc.titleAnalyzing accelerated degradation data by nonparametric regressionen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/24.784273en_US
dc.identifier.journalIEEE TRANSACTIONS ON RELIABILITYen_US
dc.citation.volume48en_US
dc.citation.issue2en_US
dc.citation.spage149en_US
dc.citation.epage158en_US
dc.contributor.department統計學研究所zh_TW
dc.contributor.departmentInstitute of Statisticsen_US
dc.identifier.wosnumberWOS:000082105800008-
dc.citation.woscount30-
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