Common-path heterodyne interferometric detection scheme for measuring wavelength shift

doi:10.1016/S0030-4018(99)00074-7

完整後設資料紀錄

DC 欄位	值	語言
dc.contributor.author	Lee, JY	en_US
dc.contributor.author	Su, DC	en_US
dc.date.accessioned	2014-12-08T15:46:45Z	-
dc.date.available	2014-12-08T15:46:45Z	-
dc.date.issued	1999-04-01	en_US
dc.identifier.issn	0030-4018	en_US
dc.identifier.uri	http://dx.doi.org/10.1016/S0030-4018(99)00074-7	en_US
dc.identifier.uri	http://hdl.handle.net/11536/31439	-
dc.description.abstract	When a linearly polarized light passes through a uniaxial crystal, small wavelength shifts will introduce phase difference variations between s- and p-polarizations, These phase difference variations can be measured accurately by heterodyne interferometry. Based on these facts, a common-path heterodyne interferometric detection scheme for measuring wavelength shift is proposed. This scheme has the advantages of both common-path interferometry and heterodyne interferometry. (C) 1999 Elsevier Science B.V. All rights reserved.	en_US
dc.language.iso	en_US	en_US
dc.subject	wavelength shift	en_US
dc.subject	heterodyne interferometry	en_US
dc.title	Common-path heterodyne interferometric detection scheme for measuring wavelength shift	en_US
dc.type	Article	en_US
dc.identifier.doi	10.1016/S0030-4018(99)00074-7	en_US
dc.identifier.journal	OPTICS COMMUNICATIONS	en_US
dc.citation.volume	162	en_US
dc.citation.issue	1-3	en_US
dc.citation.spage	7	en_US
dc.citation.epage	10	en_US
dc.contributor.department	光電工程學系	zh_TW
dc.contributor.department	Department of Photonics	en_US
dc.identifier.wosnumber	WOS:000079947000002	-
dc.citation.woscount	1	-
顯示於類別：	期刊論文

文件中的檔案：

000079947000002.pdf

若為 zip 檔案，請下載檔案解壓縮後，用瀏覽器開啟資料夾中的 index.html 瀏覽全文。