標題: | Measurement of wavelength shift by using surface plasmon resonance heterodyne interferometry |
作者: | Chen, KH Hsu, CC Su, DC 光電工程學系 Department of Photonics |
公開日期: | 1-八月-2002 |
摘要: | A linearly polarized light is incident on a surface plasmon resonance (SPR) apparatus at the resonant angle. the surface plasmons are excited, Small wavelength shifts will introduce phase difference variations between s- and p-polarizations of the reflected light. These phase difference variations can be measured accurately by using heterodyne interferometry. Based on these facts, a novel method for measuring small wavelength shifts is proposed. It has the advantages of both common-path interferometry and heterodyne interferometry. (C) 2002 Elsevier Science B.V. All rights reserved. |
URI: | http://dx.doi.org/10.1016/S0030-4018(02)01641-3 http://hdl.handle.net/11536/28618 |
ISSN: | 0030-4018 |
DOI: | 10.1016/S0030-4018(02)01641-3 |
期刊: | OPTICS COMMUNICATIONS |
Volume: | 209 |
Issue: | 1-3 |
起始頁: | 167 |
結束頁: | 172 |
顯示於類別: | 期刊論文 |