Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Lee, JY | en_US |
| dc.contributor.author | Su, DC | en_US |
| dc.date.accessioned | 2014-12-08T15:46:45Z | - |
| dc.date.available | 2014-12-08T15:46:45Z | - |
| dc.date.issued | 1999-04-01 | en_US |
| dc.identifier.issn | 0030-4018 | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1016/S0030-4018(99)00074-7 | en_US |
| dc.identifier.uri | http://hdl.handle.net/11536/31439 | - |
| dc.description.abstract | When a linearly polarized light passes through a uniaxial crystal, small wavelength shifts will introduce phase difference variations between s- and p-polarizations, These phase difference variations can be measured accurately by heterodyne interferometry. Based on these facts, a common-path heterodyne interferometric detection scheme for measuring wavelength shift is proposed. This scheme has the advantages of both common-path interferometry and heterodyne interferometry. (C) 1999 Elsevier Science B.V. All rights reserved. | en_US |
| dc.language.iso | en_US | en_US |
| dc.subject | wavelength shift | en_US |
| dc.subject | heterodyne interferometry | en_US |
| dc.title | Common-path heterodyne interferometric detection scheme for measuring wavelength shift | en_US |
| dc.type | Article | en_US |
| dc.identifier.doi | 10.1016/S0030-4018(99)00074-7 | en_US |
| dc.identifier.journal | OPTICS COMMUNICATIONS | en_US |
| dc.citation.volume | 162 | en_US |
| dc.citation.issue | 1-3 | en_US |
| dc.citation.spage | 7 | en_US |
| dc.citation.epage | 10 | en_US |
| dc.contributor.department | 光電工程學系 | zh_TW |
| dc.contributor.department | Department of Photonics | en_US |
| dc.identifier.wosnumber | WOS:000079947000002 | - |
| dc.citation.woscount | 1 | - |
| Appears in Collections: | Articles | |
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