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dc.contributor.authorWang, S. Y.en_US
dc.contributor.authorLing, H. S.en_US
dc.contributor.authorLee, C. P.en_US
dc.date.accessioned2014-12-08T15:47:07Z-
dc.date.available2014-12-08T15:47:07Z-
dc.date.issued2011-05-01en_US
dc.identifier.issn1350-4495en_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.infrared.2010.12.018en_US
dc.identifier.urihttp://hdl.handle.net/11536/31619-
dc.description.abstractThe behavior of quantum efficiency in QDIPs was studied in details with simple InAs/GaAs QDs and DWELL QDs structures. Despite of the large difference of the excited state energy between the two samples, the QE shows similar trends with temperature and bias voltage. The voltage to reach the QE plateau decreases with temperature and the maximum QE decreases with temperature. Considering the repulsive potential from the charge inside the QDs, the effective barrier height and thickness for the photoexcited carrier is much reduced and the QE variation with voltage follows the calculated tunneling probability. Furthermore, the multi-phonon interaction which leads to the relaxation of the excited carrier is shown to be important to the decrease of QE with temperature. The enhanced relaxation rate decreases the maximum QE value at higher temperature. (C) 2010 Elsevier B.V. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectQuantum doten_US
dc.subjectIntersubbanden_US
dc.subjectInfrared detectoren_US
dc.titleTemperature dependence of quantum efficiency in Quantum Dot Infrared Photodetectorsen_US
dc.typeArticle; Proceedings Paperen_US
dc.identifier.doi10.1016/j.infrared.2010.12.018en_US
dc.identifier.journalINFRARED PHYSICS & TECHNOLOGYen_US
dc.citation.volume54en_US
dc.citation.issue3en_US
dc.citation.spage224en_US
dc.citation.epage227en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000290973200015-
Appears in Collections:Conferences Paper


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