Small perturbation analysis of oblique incidence in dielectric gratings

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DC 欄位	值	語言
dc.contributor.author	Hwang, RB	en_US
dc.contributor.author	Jen, DK	en_US
dc.date.accessioned	2014-12-08T15:47:13Z	-
dc.date.available	2014-12-08T15:47:13Z	-
dc.date.issued	1998-12-20	en_US
dc.identifier.issn	0895-2477	en_US
dc.identifier.uri	http://hdl.handle.net/11536/31681	-
dc.description.abstract	In this paper, the method of first-order perturbation is proposed to investigate the plane-wane scattering by dielectric gratings with a small modulation index at oblique incidence. Under the assumption of small perturbation, the cross coupling between the fields of the polarizations (TE and TM) due to the oblique incidence cart be represented by the TE and TM transmission lines fed by distributed current and (or) voltage sources, respectively. The results show good agreement with that obtained by a rigorous formulation. (C) 1998 John Wiley & Sons, Inc.	en_US
dc.language.iso	en_US	en_US
dc.subject	dielectric gratings	en_US
dc.subject	periodic structure	en_US
dc.subject	small perturbation	en_US
dc.title	Small perturbation analysis of oblique incidence in dielectric gratings	en_US
dc.type	Article	en_US
dc.identifier.journal	MICROWAVE AND OPTICAL TECHNOLOGY LETTERS	en_US
dc.citation.volume	19	en_US
dc.citation.issue	6	en_US
dc.citation.spage	434	en_US
dc.citation.epage	437	en_US
dc.contributor.department	電信工程研究所	zh_TW
dc.contributor.department	Institute of Communications Engineering	en_US
dc.identifier.wosnumber	WOS:000077071200014	-
dc.citation.woscount	0	-
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