High resolution central fringe identification

完整後設資料紀錄

DC 欄位	值	語言
dc.contributor.author	Lee, JY	en_US
dc.contributor.author	Su, DC	en_US
dc.date.accessioned	2014-12-08T15:47:25Z	-
dc.date.available	2014-12-08T15:47:25Z	-
dc.date.issued	1998-11-01	en_US
dc.identifier.issn	0030-4018	en_US
dc.identifier.uri	http://hdl.handle.net/11536/31786	-
dc.description.abstract	A high resolution central fringe identification by using the heterodyne interferometry with a tunable laser-diode and a fixed wavelength laser is presented. It can be operated easily and can be used to judge which arm of the Michelson interferometer is longer. The feasibility is demonstrated and it has 0.2 nm resolution. (C) 1998 Elsevier Science B.V. All rights reserved.	en_US
dc.language.iso	en_US	en_US
dc.subject	central fringe	en_US
dc.subject	heterodyne interferometry	en_US
dc.title	High resolution central fringe identification	en_US
dc.type	Article	en_US
dc.identifier.journal	OPTICS COMMUNICATIONS	en_US
dc.citation.volume	156	en_US
dc.citation.issue	1-3	en_US
dc.citation.spage	1	en_US
dc.citation.epage	4	en_US
dc.contributor.department	光電工程學系	zh_TW
dc.contributor.department	Department of Photonics	en_US
dc.identifier.wosnumber	WOS:000076960300001	-
dc.citation.woscount	6	-
顯示於類別：	期刊論文

文件中的檔案：

若為 zip 檔案，請下載檔案解壓縮後，用瀏覽器開啟資料夾中的 index.html 瀏覽全文。