完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Hsu, Yao-Wen | en_US |
dc.contributor.author | Chiu, Shao-Pin | en_US |
dc.contributor.author | Lien, An-Shao | en_US |
dc.contributor.author | Lin, Juhn-Jong | en_US |
dc.date.accessioned | 2014-12-08T15:47:45Z | - |
dc.date.available | 2014-12-08T15:47:45Z | - |
dc.date.issued | 2010-11-15 | en_US |
dc.identifier.issn | 1098-0121 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1103/PhysRevB.82.195429 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/31932 | - |
dc.description.abstract | We have measured the quantum-interference magnetoresistances in two single indium tin oxide (ITO) nanowires between 0.25 and 40 K, by using the four-probe configuration method. The magnetoresistances are compared with the one-dimensional weak-(anti)localization theory to extract the electron dephasing length L(phi). We found, in a 60-nm-diameter nanowire with a low resistivity of rho(10 K) =185 mu Omega cm, that L(phi) is long, increasing from 150 nm at 40 K to 520 nm at 0.25 K. Therefore, the nanowire reveals strict one-dimensional weak-localization effect up to several tens of degrees of kelvin. In a second 72-nm-diameter nanowire with a high resistivity of rho(10 K)=1030 mu Omega cm, the dephasing length is suppressed to L(phi)(0.26 K)=200 nm, and thus a crossover of the effective device dimensionality from one to three occurs at about 12 K. In particular, disorder-induced spin-orbit coupling is evident in the latter sample, manifesting weak-antilocalization effect at temperatures below similar to 4 K. These observations demonstrate that versatile quantum-interference effects can be realized in ITO nanowires by controlling differing levels of atomic defects and impurities. | en_US |
dc.language.iso | en_US | en_US |
dc.title | Long electron dephasing length and disorder-induced spin-orbit coupling in indium tin oxide nanowires | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1103/PhysRevB.82.195429 | en_US |
dc.identifier.journal | PHYSICAL REVIEW B | en_US |
dc.citation.volume | 82 | en_US |
dc.citation.issue | 19 | en_US |
dc.citation.spage | en_US | |
dc.citation.epage | en_US | |
dc.contributor.department | 電子物理學系 | zh_TW |
dc.contributor.department | 物理研究所 | zh_TW |
dc.contributor.department | Department of Electrophysics | en_US |
dc.contributor.department | Institute of Physics | en_US |
顯示於類別: | 期刊論文 |