標題: | Asymmetric Gate Capacitance and High Frequency Characteristic Fluctuations in 16 nm Bulk MOSFETs Due to Random Distribution of Discrete Dopants |
作者: | Li, Yiming Hwang, Chih-Hong Yeh, Ta-Ching 電信工程研究所 Institute of Communications Engineering |
公開日期: | 2008 |
URI: | http://hdl.handle.net/11536/32220 |
ISBN: | 978-1-4244-2071-1 |
期刊: | 2008 IEEE SILICON NANOELECTRONICS WORKSHOP |
起始頁: | 99 |
結束頁: | 100 |
顯示於類別: | 會議論文 |