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dc.contributor.authorOu-Yang, Men_US
dc.contributor.authorSheen, CSen_US
dc.contributor.authorShie, JSen_US
dc.date.accessioned2014-12-08T15:49:13Z-
dc.date.available2014-12-08T15:49:13Z-
dc.date.issued1998-04-01en_US
dc.identifier.issn0018-9456en_US
dc.identifier.urihttp://hdl.handle.net/11536/32709-
dc.description.abstractObtaining device parameters of thermal microsensors is essential for evaluating their performances and simulation modeling. We report an sc electrical method for extracting these parameters experimentally with relatively simple instrumentation. The basic parameters of resistive microsensors, the resistance, temperature coefficient of resistance, thermal capacitance, and conductance, are derivable from the second harmonic signal of the output voltage induced by a sinusoidal driving current. The results are compared with other methods.en_US
dc.language.isoen_USen_US
dc.subjectAC electrical method thermal variables measurementen_US
dc.subjectelectrothermal effecten_US
dc.subjectparameter extractionen_US
dc.subjectthermal microsensorsen_US
dc.titleParameter extraction of resistive thermal microsensors by AC electrical methoden_US
dc.typeArticleen_US
dc.identifier.journalIEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENTen_US
dc.citation.volume47en_US
dc.citation.issue2en_US
dc.citation.spage403en_US
dc.citation.epage408en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000078557800011-
dc.citation.woscount5-
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