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dc.contributor.authorHsu, Hsing-Huien_US
dc.contributor.authorLin, Homg-Chihen_US
dc.contributor.authorLee, Ko-Huien_US
dc.contributor.authorHuang, Jian-Fuen_US
dc.contributor.authorHuang, Tiao-Yuanen_US
dc.date.accessioned2014-12-08T15:04:53Z-
dc.date.available2014-12-08T15:04:53Z-
dc.date.issued2008en_US
dc.identifier.isbn978-1-4244-1614-1en_US
dc.identifier.urihttp://hdl.handle.net/11536/3408-
dc.identifier.urihttp://dx.doi.org/10.1109/VTSA.2008.4530818en_US
dc.language.isoen_USen_US
dc.titleCharacteristics of poly-Si nanowire transistors with multiple-gate configurationsen_US
dc.typeProceedings Paperen_US
dc.identifier.doi10.1109/VTSA.2008.4530818en_US
dc.identifier.journal2008 INTERNATIONAL SYMPOSIUM ON VLSI TECHNOLOGY, SYSTEMS AND APPLICATIONS (VLSI-TSA), PROCEEDINGS OF TECHNICAL PROGRAMen_US
dc.citation.spage101en_US
dc.citation.epage102en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000256564900047-
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