標題: PRECISE DETERMINATION OF ALUMINUM CONTENT IN ALGAAS
作者: CHANG, KH
LEE, CP
WU, JS
LIU, DG
LIOU, DC
WANG, MH
CHEN, LJ
MARAIS, MA
電控工程研究所
Institute of Electrical and Control Engineering
公開日期: 1-十一月-1991
摘要: The Al composition of AlGaAs has been determined by four methods: high-resolution transmission electron microscopy (HRTEM), reflection high-energy electron diffraction (RHEED), photoluminescence (PL), and double-crystal x-ray diffraction (DCXRD). HRTEM is direct and the most accurate method because it does not involve any formula or extrapolation. Using the result obtained from HRTEM as a standard, we have calibrated the results from other methods. RHEED intensity oscillation is found to be accurate and reliable, if the growth conditions are correctly chosen. Comparing the PL results with those determined from HRTEM and RHEED, we suggest three formulas to determine the Al contents at different temperatures. We also proposed a polynomial to determine the Al concentration using the DCXRD measurement.
URI: http://dx.doi.org/10.1063/1.349030
http://hdl.handle.net/11536/3638
ISSN: 0021-8979
DOI: 10.1063/1.349030
期刊: JOURNAL OF APPLIED PHYSICS
Volume: 70
Issue: 9
起始頁: 4877
結束頁: 4882
顯示於類別:期刊論文