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dc.contributor.authorWU, JSen_US
dc.contributor.authorCHANG, CYen_US
dc.contributor.authorLEE, CPen_US
dc.contributor.authorCHANG, KHen_US
dc.contributor.authorLIU, DGen_US
dc.date.accessioned2014-12-08T15:05:16Z-
dc.date.available2014-12-08T15:05:16Z-
dc.date.issued1991-04-01en_US
dc.identifier.issn0038-1101en_US
dc.identifier.urihttp://hdl.handle.net/11536/3818-
dc.description.abstractThe electrical characteristics of AlGaAs/GaAs double-barrier resonant tunneling structures with various electrode doping concentrations have been studied. It was found that the peak current and the valley current are not sensitive to the change in the doping level of the electrodes. The peak-current voltage and the valley-current voltage, however, increase when the electrode doping level is lowered. These behaviors are explained using the band-bending effect in the electrodes. For devices with lightly doped or undoped electrodes, the quantum size effect in the accumulation layer due to the strong band bending causes additional kinks in the current-voltage characteristics. They are attributed to the resonant tunneling of electrons from the quantized levels in the accumulation layer. The quantum effect also accounts for the improved negative differential resistance behavior.en_US
dc.language.isoen_USen_US
dc.titleELECTRICAL CHARACTERISTICS OF DOUBLE-BARRIER RESONANT TUNNELING STRUCTURES WITH DIFFERENT ELECTRODE DOPING CONCENTRATIONSen_US
dc.typeArticleen_US
dc.identifier.journalSOLID-STATE ELECTRONICSen_US
dc.citation.volume34en_US
dc.citation.issue4en_US
dc.citation.spage403en_US
dc.citation.epage411en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:A1991FD59600011-
dc.citation.woscount6-
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