以資料倉儲為基礎建構整合在製品資訊系統－以半導體廠為例

Abstract

半導體業的生產過程中包含不同生產階段，有 Wafer Process(晶圓加工)、 CP(晶圓測試)、AP(封裝)、FT（測試）及最後的成品倉(WH)階段，各階段所採用的製造執行系統或生產控制系統並不相同，即便是同一階段，如 Wafer Process，各廠的生產控制系統也未必相同，各系統間獨立運作，或以特定之介面作資料交換，導致想要追蹤Lot資訊變成複雜的工作。

整合資料過程中，要追蹤一個Lot目前的位置，必須要搜尋所有MES系統和生產資系統之後，才能確定Lot目前正確位置；運作效能(Performance)不好，程式執行所花時間過長及整合資料所需邏輯複雜，而且各系統間存在著系統時間差異，處理交換資料的所需時間，會發生在各生產階段交接點上可能會出現Lot失蹤的情況。

本研究則是提出以資料倉儲所建構整合性在製品資訊系統。讓在製品管理者能依其需求快速正確地取得所需Lot的資訊。

There are different stages in the production process of the semiconductor fabrication. They have WP(Wafer Process) , CP (Circuit Probing) , AP (Assembly ) , FT (Final Test ) and the last stage WH (Warehouse ) . The manufacture executive systems or production control systems are not the same at every stage. Even if it is at the same stage, such as Wafer Process, the manufacture executive systems of every fabrication may not be the same either. Operated independently among every system, or the data exchange with the specific interface, tracking of lot of information is a complicated work. Tracking where the lot is, we must be able to monitor search all MES activities in production control systems. Without data warehouse, to integrate different programs in a coherent way is very complicated and degrade the performance. There are time differences among the system. When preprocessing data, lot may disappear by the point of the transfer stage. This research is to propose a data warehouse oriented Total WIP System. WIP manager can get the lot information fast and correctly.