標題: COMPOSITIONAL DEPENDENCE OF THERMAL-STABILITY OF REFRACTORY-METAL SILICIDE SCHOTTKY CONTACTS TO GAAS
作者: LEE, CP
LIU, TH
WU, SC
奈米中心
Nano Facility Center
公開日期: 1-Sep-1989
URI: http://dx.doi.org/10.1007/BF02657477
http://hdl.handle.net/11536/4302
ISSN: 0361-5235
DOI: 10.1007/BF02657477
期刊: JOURNAL OF ELECTRONIC MATERIALS
Volume: 18
Issue: 5
起始頁: 623
結束頁: 626
Appears in Collections:Articles